A Brief Review for Semiconductor Memory Testing Based on BIST Techniques

 
 
 
  • Abstract
  • Keywords
  • References
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  • Abstract


    With rapid growth of semiconductor industry and increase in complexity of semiconductor based memory, necessity of stringent testing methodology has become one of top most criteria for memory evaluation. This paper describes the fundamental concepts and overview of Built-In-Self-Test (BIST). It describes different functional faults modeling of RAM and flash memory. This review mentions about testing approaches for memory and illustrates BIST techniques for finding faults, power dissipation, area overhead and test time during testing, also includes research gap and future scope regarding the testing of memory.

     

     


  • Keywords


    BIST, fault functional modeling, flash memory, RAM, and test algorithm.

  • References


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Article ID: 16807
 
DOI: 10.14419/ijet.v7i3.1.16807




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