SIEW KHEW, Koh; CHING HERNY, Chin; YI FEI, Tan; AH HIN, Pooi; YONG KHENG, Goh; MIN CHERNG, Lee; TAN CHING, Ng. Repairable Queue with Non-exponential Interarrival Time and Variable Breakdown Rates. International Journal of Engineering & Technology, [S. l.], v. 7, n. 2.15, p. 76–80, 2018. DOI: 10.14419/ijet.v7i2.15.11218. Disponível em: https://www.sciencepubco.com/index.php/ijet/article/view/11218.. Acesso em: 2 may. 2024.