The Error-Correcting Coding in Information Storage Modules with Increased Radiation Resistance

 
 
 
  • Abstract
  • Keywords
  • References
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  • Abstract


    This article is devoted to the study and analysis of various noise-resistant code structures, which are designed for use in miniature memory drives on spacecrafts. Error-correcting coding is aimed for correcting memory errors that occur due to ionizing radiation. The first part of the article provides information about the general memory architecture using error-correcting coding. The second part considers linear code constructions, such as Hamming code, convolutional code, PC and LDPC code, as well as nonlinear code constructions, which are promising means of correcting memory errors (Vasiliev code, Phelps code, switching code, AMD-code).

     Based on the research and analysis data, the conclusion is made about the most suitable code design for the development of the information storage module. It should be noted that the determining requirement for choosing the code for the drive used on the spacecraft is the presence of simple decoding algorithms that allow high decoding speed and low energy consumption.

     

     


  • Keywords


    error-correcting coding, Hamming code, linear code, nonlinear code, Phelps code, switching code, Vasiliev code.

  • References


      [1] G. Atwood, A. Fazio, D. Mills, B. Reaves. / Intel Strata FlashTM memory technology overview // Intel Technology Journal. 1997.

      [2] R. Dan, R. Singer. / White paper: Implementing MLC NAND flash for cost-effective, high capacity memory / M-Systems. 2003.

      [3] J. Bellorado, E.Yaakobi, A. Jiang. // Non-Volatile Memory Workshop, Center for Magnetic Recording Research, University of California, San Diego. March 3rd..2013.

      [4] L.M. Grupp, A.M. Caulfield, J. Coburn, at al. / Characterizing flash memory: Anomalies, observations, and applications. // In Proc. 41st IEEE/ACM Int. Symp. Microarch. (MICRO). 2009. P.24-33.105

      [5] N. Mielke, T. Marquart, N. Wu, at al. / Biterror rate in NAND flash memories // In Proc. 46th Annu. Int. Reliab. Phys. Symp. 2008. P.9-19.

      [6] Desnoyers, P. / Empirical evaluation of NAND-flash memory performance // SIGOPS Oper. Syst.Rev. 2010. V.44. N.1. P. 50-54.

      [7] N. Agrawal, V. Prabhakaran, T. Wobber, at al. / Design tradeoffs for SSD performance // In Proc. USENIX Annu. Techn. Conf. Annu. Techn.Conf. 2008. P.57-70.

      [8] T. Jianzhong, Q. Qinglin, B. Feng, at al. / Study and design on high reliability mass capacity memory // In Proc. IEEE Int. Conf. Softw. Eng. Service Sci.2010. P.701-704.

      [9] F. sun, S. Devarjan, K. rose, T. Zhang. / design of systems on a chip for error correction for multi-level nor and NAND flash memory // IEPP circuits, devices and systems.2007.B. 1.N. 3.P. 241-249

      [10] Cota, E.; Carro, L.; Lubaszewski, M.; Velazco, R.; Rezgui. / S.Synthesis of 8051-like Microcontroller Tolerant to Transient Faults. In: 1st IEEE Latin America Test Workshop (LATW), Brazil, 2000.

      [11] Sagalovich Yu. L. / Introduction to algebraic codes — 3rd ed., pererab. // I DOP. - M.: IPPI RAS, 2014. - 310 p. - ISBN 978-5-901158-24-1.

      [12] Z. Wang, M. Karpovsky, K. J. Kulikovski. / replacement linear Hamming codes buy reliable results of nonlinear codes to improve the reliability of memories // Materials of the international conference IEEE / IFIP on Dependable systems and networks.2009.P. 514– 523.111

      [13] Z. Wang, M. Karpovsky, A. Joshi. / reliable flash memory MLC NAND based on nonlinear error correction T-codes // Proceedings of the international conference on reliable systems and networks.2010.

      [14] Z. Wang, M. Karpovsky, K. J. Kulikovskii. / the Design of a memory with parallel detection and correction of errors by Nin-linear codes SEC-DED // journal of electronic testing.2010.B. 26. P.559-580.

      [15] P. Lo, Z. Wang, M. G. Karpovsky. / safe NAND flash drives are resistant to strong fault-injection attacks using algebraic manipulation detection codes // proc.Doc. Int.Conference on security and management, Sam. 2013.

      [16] T. Etzion, A.Vardy. / On perfect codes and tilings: problems and solutions // SIAM J. Discrete Math.1998.V. 11.N. 2. P. 205-223.

      [17] Mollar, M. / A generalized parity function and its use in the construction of perfect codes / / SIAM J. Alg. Disc. Meth.1986.V. 7.N. 1.P. 113-115.

      [18] Phelps, K. T. / A General Product Construction for Error Correcting Codes // SIAM J. Algebraic Discrete Methods.1984.N.5.P. 224-228.


 

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Article ID: 20539
 
DOI: 10.14419/ijet.v7i4.7.20539




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