Copper recovery from chalcopyrite flotation plant tailings acid leach using ion exchange resin dowtm XUS 43578.00

  • Authors

    • Melvin M. Mashingaidze
    • Catherine N. Shifotoka
    2018-04-20
    https://doi.org/10.14419/ijet.v7i2.23.12752
  • Acid Leach, Copper Tailings, Distribution Coefficient, DOWTM XUS 43578.00ion Exchange Resin, Separation Factor.

  • This study examined the feasibility of recovering copper from a sulphuric acid leach solution of chalcopyrite flotation plant tailings assaying 0.18 % copper and 0.19 % zinc using DOWTM XUS 43578.00 ion exchange resin. Zn2+cations are counter ionsto Cu2+cations during the ion exchange process. Adsorption and desorption tests were conducted on the resin with a leach solution containing26 mg Cu/L and 225 mg Zn/L,under various conditions of pH, DOWTM XUS 43578.00resin dosage, agitation time and eluant(ammonium hydroxide solution) concentration. The DOWTM XUS 43578.00resindemonstrated a high selectivity for copper over zinc, with a separation factor of 30.26 mg/g. The highcopper distribution coefficient of65L2/g2suggeststhe resin can effectively concentrate copper in leach solutions of these particular tailings.A 4M ammonium hydroxide solution yielded the highest copper recoveryat pH 3and0.6gresin dosageafter3hours of agitation. These results can be improved by a pre-treatment step to remove the zinc before the copper ion exchange process, and modifying the experiments to simulate industrial practice by having multi-stage sorption and desorption phases.

     

  • References

    1. [1] Leonard W(2013), Optimisation of the Recovery of Copper by Oxidative Leaching of Otjihase Mine Tailings,Personal Communications.

      [2] WenJ, ZhangQ, ZhangG &CaoZ(2010), Deep removal of copper from cobalt sulfate electrolyte by ion exchange, Transactions of Nonferrous Metals Society of China, vol. 20, 1534-1540.

      [3] NguyenNV, LeeJC, JhaMK, YooK & Jeong J (2009), Copper recovery from low concentration waste solution using Dowex G-26 resin, Journal of Hydrometallurgy, vol. 97, 237-242.

      [4] HarlandC(1994), Ion Exchange: Theory and Practice, Cambridge : Royal Society of Chemistry.

      [5] Dow Chemical Company (2015), DOWTM XUS 43578, available online: http://www.msdssearch.dow.com. Last visit 15.06.2017.

      [6] Liberti L&MillarJ(2012), Fundamentals and Applications ofIon Exchange, Springer.

      [7] HelfferichF (1962), Ion Exchange, Courier Dover.

      [8] ZagorodniA(2006), Ion Exchange Materials: Properties and Applications, Elsevier.

      [9] LiebenbergC, DorflingC, BradshawS, AkdoganG&EksteenJ (2013), The recovery of copper from a pregnant sulphuric acid bioleach solution with developmental resin DOW XUS43605,The Journal of the Southern African Institute of Mining and Metallurgy, vol. 113, 389-397.

      [10] JaninA,BlaisJF, MercierG &DroguiP (2009), Selective recovery of Cr and Cu in leachate from chromated copper arsenate treated wood using chelating and acidic ion exchange resins, Journal of Hazardous Materials, vol. 169, 1099-1105.

      [11] DinizC, CiminelliV&DoyleF (2005), The use of the chelating resin Dowex-M4195 in the adsorption of selected heavy metal ions from managanese solutions, Journal of Hydrometallurgy, vol. 78 no. 3-4, 147-155.

      [12] DaveR, DaveG &MishraV (2010), Removal of copper from electroplating waste water by weakly basic chelating anion exchange resins: Dowex 50X4, Dowex 50X2, and Dowex M-4195, Journal of Der Pharma Chemica, vol. 2 no. 2, 327-335.

      [13] DorfnerK,KühneG, GrubhoferN &StrobelGJ (2011), Ion exchangers, Walter de Gruyter, Berlin.

      [14] LuqmanMD (2012), Ion Exchange Technology I: Theory and Materials, Springer,.

      [15] VeliS &PekeyB (2004), Removal of copper from aqueous solution by ion exchange resins, Frensius Environmental Bulletin, vol. 13 no. 3b, 244-250.

  • Downloads

  • How to Cite

    M. Mashingaidze, M., & N. Shifotoka, C. (2018). Copper recovery from chalcopyrite flotation plant tailings acid leach using ion exchange resin dowtm XUS 43578.00. International Journal of Engineering & Technology, 7(2.23), 317-322. https://doi.org/10.14419/ijet.v7i2.23.12752