Karthikeyini, C, and K Anandhi. “A New Hybrid Test Pattern Generator for Stuck-at –Fault and Path Delay Fault in Scan Based Bist”. International Journal of Engineering and Technology 7, no. 3.27 (August 15, 2018): 476–480. Accessed February 23, 2026. https://www.sciencepubco.com/index.php/IJET/article/view/18000.